Thermal cycling induces fatigue failure in solder interconnects due to CTE mismatch, a primary cause of field returns in automotive, aerospace, and consumer electronics. Manual simulation and analysis of this physics is slow, expensive, and limits design iteration. This workflow automates the entire virtual testing pipeline—from CAD import to life prediction—enabling engineers to evaluate thousands of design and material permutations. The result is a 10-15x acceleration in reliability assessment, reducing physical test cycles and preventing costly warranty claims by identifying failure modes before production.




